Atomic Force Microscopy - E-book

eBook

Atomic Force Microscopy - ENG

Understanding Basic Modes And Advanced Applications

Greg Haugstad

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$2,800.00

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Sinopsis

ISBN:	9781118360682
Formato:	ePub
Idioma:	Inglés
Editorial:	Wiley Global Research (STMS)
Tema:	Ciencia
Subtema:	Microscopios y Microscopia
Año de publicación:	20120904

This bookÂ enlightens readers onÂ the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. â€œSupplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.comâ€?

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