High-level Estimation and Explorati - E-book

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High-level Estimation And Exploration Of Reliability For Multi-processor System-on-chip - ENG

Zheng Wang; Anupam Chattopadhyay

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Sinopsis

ISBN:	9789811010736
Formato:	Page Fidelity
Idioma:	Inglés
Editorial:	Springer Nature
Tema:	Tecnología e ingeniería
Subtema:	Eletrónica circuitos
Año de publicación:	2017-06-23

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.Â

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