New Horizons of Applied Scanning El - E-book

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New Horizons Of Applied Scanning Electron Microscopy - ENG

Kenichi Shimizu; Tomoaki Mitani

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Sinopsis

ISBN:	9783642031601
Formato:	Page Fidelity
Idioma:	Inglés
Editorial:	Springer Nature
Tema:	Tecnología e ingeniería
Subtema:	Medición
Año de publicación:	2009-11-19

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

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