Temperature Measurement During Millisecond Annealing - ENG
Ripple Pyrometry For Flash Lamp Annealers
| ISBN: | 9783658113889 |
|---|---|
| Formato: | Page Fidelity |
| Idioma: | Inglés |
| Editorial: | Springer Nature |
| Tema: | Ciencia |
| Subtema: | Física materia condensada |
| Año de publicación: | 2016-01-07 |
Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal annealing to apply to millisecond annealing. The author presents a new method independent of the lamp operation to obtain this amplitude modulation and derives a formula to describe the process. Further, she investigates the variables of the formula in depth to validate the method suitability for background-corrected temperature measurement. The experimental results finally proof its power for elevated temperatures.










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